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Filters: Author is A.R. Krauss [Clear All Filters]
"Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties." Integrated Ferroelectrics 32 (2001) 121-131..
"Studies of hydrogen-induced degradation processes in Pb(Zr1-xTix)O3 (PZT) and SrBi2Ta2O9 (SBT) ferroelectric film-based capacitors." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 147-157..