Publications

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1999
Nagarajan, V., C.S. Ganpule, B. Nagaraj, S. Aggarwal, S.P. Alpay, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh. "Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O3(90%)-PbTiO3(10%) relaxor thin films." Applied Physics Letters 75 (1999) 4183-4185.
Alpay, S.P., V. Nagarajan, L.A. Bendersky, M.D. Vaudin, S. Aggarwal, Ramamoorthy Ramesh, and A.L. Roytburd. "Effect of the electrode layer on the polydomain structure of epitaxial PbZr0.2Ti0.8O3 thin films." Journal of Applied Physics 85 (1999) 3271-3277.
Alpay, S.P., Ramamoorthy Ramesh, and A.L. Roytburd. "Effect of uniaxial stress fields on the domain selection of epitaxial ferroelectric films." Ferroelectrics 221 (1999) 245-250.
Alpay, S.P., V. Nagarajan, L.A. Bendersky, M.D. Vaudin, S. Aggarwal, Ramamoorthy Ramesh, and A.L. Roytburd. "The stress state and domain structure of epitaxial PbZr0.2Ti0.8O3 films on (001) SrTiO3 with and without la0.5r0.5CoO3 electrode layer." Materials Research Society Symposium - Proceedings. Vol. 541. 1999. 357-362.
Nagarajan, V., I.G. Jenkins, S.P. Alpay, H. Li, S. Aggarwal, L. Salamanca-Riba, A.L. Roytburd, and Ramamoorthy Ramesh. "Thickness dependence of structural and electrical properties in epitaxial lead zirconate titanate films." Journal of Applied Physics 86 (1999) 595-602.
2000
Canedy, C.L., H. Li, S.P. Alpay, L. Salamanca-Riba, A.L. Roytburd, and Ramamoorthy Ramesh. "Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin films: Effect of internal stresses and dislocation-type defects." Applied Physics Letters 77 (2000) 1695-1697.
Ganpule, C.S., V. Nagarajan, S.B. Ogale, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh. "Domain nucleation and relaxation kinetics in ferroelectric thin films." Applied Physics Letters 77 (2000) 3275-3277.
Nagarajan, V., S.P. Alpay, C.S. Ganpule, B. Nagaraj, S. Aggarwal, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh. "Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness." Materials Research Society Symposium - Proceedings. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 505-510.
Roytburd, A.L., S.P. Alpay, V. Nagarajan, C.S. Ganpule, S. Aggarwal, E.D. Williams, and Ramamoorthy Ramesh. "Measurement of internal stresses via the polarization in epitaxial ferroelectric films." Physical Review Letters 85 (2000) 190-193.
Nagarajan, V., S.P. Alpay, C.S. Ganpule, B.K. Nagaraj, S. Aggarwal, E.D. Williams, A.L. Roytburd, and Ramamoorthy Ramesh. "Role of substrate on the dielectric and piezoelectric behavior of epitaxial lead magnesium niobate-lead titanate relaxor thin films." Applied Physics Letters 77 (2000) 438-440.

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