Publications

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Ramesh, Ramamoorthy, J. Lee, V.G. Keramidas, D.K. Fork, S. Ghonge, E. Goo, and O. Auciello. "Interfaces in ferroelectric metal oxide heterostructures." Materials Research Society Symposium - Proceedings. Vol. 343. Materials Research Society, Pittsburgh, PA, United States, 1994. 431-443.
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Gruverman, A., O. Auciello, Ramamoorthy Ramesh, and H. Tokumoto. "Scanning force microscopy of domain structure in ferroelectric thin films: Imaging and control." Nanotechnology 8 (1997) A38-A43.
Ramesh, Ramamoorthy, S. Aggarwal, and O. Auciello. "Science and technology of ferroelectric films and heterostructures for non-volatile ferroelectric memories." Materials Science and Engineering: R: Reports 32 (2001) 191-236.
Ramirez, M.O., A. Kumar, S.A. Denev, Y.H. Chu, J. Seidel, L.W. Martin, S.-Y. Yang, R.C. Rai, X.S. Xue, J.F. Ihlefeld, N.J. Podraza, E. Saiz, S. Lee, J. Klug, S.W. Cheong, M.J. Bedzyk, O. Auciello, D.G. Schlom, J. Orenstein, Ramamoorthy Ramesh, J.L. Musfeldt, A.P. Litvinchuk, and V. Gopalan. "Spin-charge-lattice coupling through resonant multimagnon excitations in multiferroic BiFe O3." Applied Physics Letters 94 (2009).
Krauss, A.R., O. Auciello, A.M. Dhote, J. Im, S. Aggarwal, Ramamoorthy Ramesh, E.A. Irene, Y. Gao, and A.H. Mueller. "Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties." Integrated Ferroelectrics 32 (2001) 121-131.
Auciello, O., A.R. Krauss, J. Im, A. Dhote, D.M. Gruen, E.A. Irene, Y. Gao, A.H. Mueller, and Ramamoorthy Ramesh. "Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques." Integrated Ferroelectrics 28 (2000) 1-12.
Auciello, O., A.R. Krauss, I.M. Jaemo, A. Dhote, D.M. Gruen, S. Aggarwal, Ramamoorthy Ramesh, E.A. Irene, Y. Gao, and A.H. Mueller. "Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 103-118.
Krauss, A.R., A. Dhote, O. Auciello, J. Im, Ramamoorthy Ramesh, and S. Aggarwal. "Studies of hydrogen-induced degradation processes in Pb(Zr1-xTix)O3 (PZT) and SrBi2Ta2O9 (SBT) ferroelectric film-based capacitors." Integrated Ferroelectrics. Vol. 27. Gordon & Breach Science Publ Inc, Newark, 1999. 147-157.

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