Publications
"Deposition and electrical characterization of dielectric/ferromagnetic heterostructure." Materials Research Society Symposium - Proceedings. Vol. 602. 2000. 363-370.
. "Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness." Materials Research Society Symposium - Proceedings. Vol. 596. Materials Research Society, Warrendale, PA, United States, 2000. 505-510.
. "Study of ultra-fast polarization switching in thin film ferroelectric capacitors." 2002 International Topical Meeting on Microwave Photonics, MWP 2002 - Technical Digest. Institute of Electrical and Electronics Engineers Inc., 2002. 197-200.
. "Activation fields in ferroelectric thin film capacitors: Area dependence." Applied Physics Letters 73 (1998) 3366-3368.
"Application of an ultrafast photonic technique to study polarization switching dynamics of thin-film ferroelectric capacitors." Journal of Lightwave Technology 21 (2003) 3282-3291.
. "(Ba,Sr)TiO3 thin films with conducting perovskite electrodes for dynamic random access memory applications." Applied Physics Letters 74 (1999) 3194-3196.
. "Can lead nonstoichiometry influence ferroelectric properties of Pb(Zr,Ti)O3 thin films?." Applied Physics Letters 75 (1999) 716-718.
"Conducting diffusion barriers for integration of ferroelectric capacitors on Si." Integrated Ferroelectrics 25 (1999) 205-221.
"Correlation between oxidation resistance and crystallinity of Ti-Al as a barrier layer for high-density memories." Acta Materialia 48 (2000) 3387-3394.
. "Effect of mechanical constraint on the dielectric and piezoelectric behavior of epitaxial Pb(Mg1/3Nb2/3)O3(90%)-PbTiO3(10%) relaxor thin films." Applied Physics Letters 75 (1999) 4183-4185.
. "Electroresistance and electronic phase separation in mixed-valent manganites." Physical Review Letters 86 (2001) 5998-6001.
. "High density ferroelectric memories: Materials, processing and scaling." Integrated Ferroelectrics 28 (2000) 213-225.
. "Influence of contact electrodes on leakage characteristics in ferroelectric thin films." Journal of Applied Physics 90 (2001) 375-382.
. "Interface characterization of all-perovskite oxide field effect heterostructures." Journal of Electroceramics 8 (2002) 233-241.
. "Leakage current mechanisms in lead-based thin-film ferroelectric capacitors." Physical Review B - Condensed Matter and Materials Physics 59 (1999) 16022-16027.
. "Low-temperature integration of lead-based ferroelectric capacitors on Si with diffusion barrier layer." Applied Physics Letters 80 (2002) 3599-3601.
. "Oxide electrodes as barriers to hydrogen damage of Pb(Zr,Ti)O3-based ferroelectric capacitors." Applied Physics Letters 74 (1999) 3023-3025.
. "Radiation damage and its recovery in focused ion beam fabricated ferroelectric capacitors." Journal of Applied Physics 92 (2002) 3275-3278.
. "Switching properties of Pb(Nb, Zr,Ti)O3 capacitors using SrRuO3 electrodes." Applied Physics Letters 75 (1999) 1787-1789.
"Ultrafast polarization switching in thin-film ferroelectrics." Applied Physics Letters 84 (2004) 1174-1176.
.