Publications

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2020

2019

Steffes, J.J., R.A. Ristau, Ramamoorthy Ramesh, and B.D. Huey."Thickness scaling of ferroelectricity in BiFeO 3 by tomographic atomic force microscopy."Proceedings of the National Academy of Sciences of the United States of America 116 (2019) 2413-2418. DOI

2018