Publications

X Author: O. Auciello

2009

Ramirez, M.O., A. Kumar, S.A. Denev, N.J. Podraza, X.S. Xu, R.C. Rai, Y.H. Chu, J. Seidel, L.W. Martin, S.-Y. Yang, E. Saiz, J.F. Ihlefeld, S. Lee, J. Klug, S.W. Cheong, M.J. Bedzyk, O. Auciello, D.G. Schlom, Ramamoorthy Ramesh, J. Orenstein, J.L. Musfeldt, and V. Gopalan."Magnon sidebands and spin-charge coupling in bismuth ferrite probed by nonlinear optical spectroscopy."Physical Review B - Condensed Matter and Materials Physics 79 (2009). DOI
Ramirez, M.O., A. Kumar, S.A. Denev, Y.H. Chu, J. Seidel, L.W. Martin, S.-Y. Yang, R.C. Rai, X.S. Xue, J.F. Ihlefeld, N.J. Podraza, E. Saiz, S. Lee, J. Klug, S.W. Cheong, M.J. Bedzyk, O. Auciello, D.G. Schlom, J. Orenstein, Ramamoorthy Ramesh, J.L. Musfeldt, A.P. Litvinchuk, and V. Gopalan."Spin-charge-lattice coupling through resonant multimagnon excitations in multiferroic BiFe O3."Applied Physics Letters 94 (2009). DOI

2003

Nagarajan, V., A. Roytburd, A. Stanishevsky, S. Prasertchoung, T. Zhao, L. Chen, J. Melngailis, O. Auciello, and Ramamoorthy Ramesh."Dynamics of ferroelastic domains in ferroelectric thin films."Nature Materials 2 (2003) 43-47. DOI
Fan, W., S. Saha, J.A. Carlisle, O. Auciello, R.P.H. Chang, and Ramamoorthy Ramesh."Layered Cu-based electrode for high-dielectric constant oxide thin film-based devices."Applied Physics Letters 82 (2003) 1452-1454. DOI
Fan, W., B. Kabius, J.M. Miller, S. Saha, J.A. Carlisle, O. Auciello, R.P.H. Chang, and Ramamoorthy Ramesh."Materials science and integration bases for fabrication of (Ba xSr1-x)TiO3 thin film capacitors with layered Cu-based electrodes."Journal of Applied Physics 94 (2003) 6192-6200. DOI

2002

Auciello, O., A.M. Dhote, Ramamoorthy Ramesh, B.T. Liu, S. Aggarwal, A.H. Mueller, N.A. Suvarova, and E.A. Irene."Development of materials integration strategies for electroceramic film-based devices via complementary in situ and ex situ studies of film growth and interface processes."Integrated Ferroelectrics 46 (2002) 295-306. DOI
Liu, B.T., K. Maki, S. Aggarwal, B. Nagaraj, V. Nagarajan, L. Salamanca-Riba, Ramamoorthy Ramesh, A.M. Dhote, and O. Auciello."Low-temperature integration of lead-based ferroelectric capacitors on Si with diffusion barrier layer."Applied Physics Letters 80 (2002) 3599-3601. DOI

2001

Ramesh, Ramamoorthy, S. Aggarwal, and O. Auciello."Science and technology of ferroelectric films and heterostructures for non-volatile ferroelectric memories."Materials Science and Engineering: R: Reports 32 (2001) 191-236. DOI
Krauss, A.R., O. Auciello, A.M. Dhote, J. Im, S. Aggarwal, Ramamoorthy Ramesh, E.A. Irene, Y. Gao, and A.H. Mueller."Studies of ferroelectric film growth and capacitor interface processes via in situ analytical techniques and correlation with electrical properties."Integrated Ferroelectrics 32 (2001) 121-131.
Dhote, A.M., O. Auciello, D.M. Gruen, and Ramamoorthy Ramesh."Studies of thin film growth and oxidation processes for conductive Ti-Al diffusion barrier layers via in situ surface sensitive analytical techniques."Applied Physics Letters 79 (2001) 800-802. DOI

2000

Aggarwal, S., B. Nagaraj, I.G. Jenkins, H. Li, R.P. Sharma, L. Salamanca-Riba, Ramamoorthy Ramesh, A.M. Dhote, A.R. Krauss, and O. Auciello."Correlation between oxidation resistance and crystallinity of Ti-Al as a barrier layer for high-density memories."Acta Materialia 48 (2000) 3387-3394. DOI
Auciello, O., A.R. Krauss, J. Im, A. Dhote, D.M. Gruen, E.A. Irene, Y. Gao, A.H. Mueller, and Ramamoorthy Ramesh."Studies of ferroelectric heterostructure thin films and interfaces, via in situ analytical techniques."Integrated Ferroelectrics 28 (2000) 1-12. DOI

1999

Auciello, O., A.R. Krauss, I.M. Jaemo, A. Dhote, D.M. Gruen, S. Aggarwal, Ramamoorthy Ramesh, E.A. Irene, Y. Gao, and A.H. Mueller."Studies of ferroelectric heterostructure thin films, interfaces, and device-related processes via in situ analytical techniques."Integrated Ferroelectrics 27 (1999) 103-118. DOI
Krauss, A.R., A. Dhote, O. Auciello, J. Im, Ramamoorthy Ramesh, and S. Aggarwal."Studies of hydrogen-induced degradation processes in Pb(Zr1-xTix)O3 (PZT) and SrBi2Ta2O9 (SBT) ferroelectric film-based capacitors."Integrated Ferroelectrics 27 (1999) 147-157. DOI
Dhote, A.M., A.R. Krauss, O. Auciello, J. Im, D.M. Gruen, Ramamoorthy Ramesh, S.P. Pai, and T. Venkatesan."Studies of metallic species incorporation during growth of SrBi2Ta2O9 films on YBa2Cu3O7-x substrates using mass spectroscopy of recoiled ions."Materials Research Society Symposium - Proceedings 541 (1999) 281-286.

1998

Gruverman, A., S.A. Prakash, S. Aggarwal, Ramamoorthy Ramesh, O. Auciello, and H. Tokumoto."Nanoscale investigation of polarization retention loss in ferroelectric thin films via scanning force microscopy."Materials Research Society Symposium - Proceedings 493 (1998) 53-58.
Auciello, O., A. Gruverman, H. Tokumoto, S.A. Prakash, S. Aggarwal, and Ramamoorthy Ramesh."Nanoscale scanning force imaging of polarization phenomena in ferroelectric thin films."MRS Bulletin 23 (1998) 33-41.
Auciello, O., J.F. Scott, and Ramamoorthy Ramesh."The physics of ferroelectric memories."Physics Today 51 (1998) 22-27. DOI
Auciello, O., C.M. Foster, and Ramamoorthy Ramesh."Processing technologies for ferroelectric thin films and heterostructures."Annual Review of Materials Science 28 (1998) 501-531. DOI
Im, J., A.R. Krauss, A.M. Dhote, D.M. Gruen, O. Auciello, Ramamoorthy Ramesh, and R.P.H. Chang."Studies of metallic species and oxygen incorporation during sputter-deposition of SrBi2Ta2O9 films, using mass spectroscopy of recoiled ions."Applied Physics Letters 72 (1998) 2529-2531. DOI

1997

Gruverman, A., H. Tokumoto, A.S. Prakash, S. Aggarwal, B. Yang, M. Wuttig, Ramamoorthy Ramesh, O. Auciello, and T. Venkatesan."Nanoscale imaging of domain dynamics and retention in ferroelectric thin films."Applied Physics Letters 71 (1997) 3492-3494. DOI
Gruverman, A., O. Auciello, Ramamoorthy Ramesh, and H. Tokumoto."Scanning force microscopy of domain structure in ferroelectric thin films: Imaging and control."Nanotechnology 8 (1997) A38-A43. DOI

1996

Auciello, O., and Ramamoorthy Ramesh."Electroceramic Thin Films Part I: Processing."MRS Bulletin 21 (1996) 21-24. DOI
Auciello, O., and R. Ramamoorthy."Electroceramic Thin Films Part II: Device Applications."MRS Bulletin 21 (1996) 29-32. DOI
Auciello, O., and Ramamoorthy Ramesh."Laser-ablation deposition and characterization of ferroelectric capacitors for nonvolatile memories."MRS Bulletin 21 (1996) 31-36. DOI