Publications

X Author: A.L. Roytburd

2007

Ouyang, J., J. Slusker, I. Levin, D.-M. Kim, C.-B. Eom, Ramamoorthy Ramesh, and A.L. Roytburd."Engineering of self-assembled domain architectures with ultra-high piezoelectric response in epitaxial ferroelectric films."Advanced Functional Materials 17 (2007) 2094-2100. DOI

2006

Ouyang, J., Ramamoorthy Ramesh, and A.L. Roytburd."Theoretical investigation of the intrinsic piezoelectric properties for tetragonal BaTiO 3 epitaxial films."Applied Surface Science 252 (2006) 3394-3400. DOI

2005

Ma, Z., F. Zavaliche, L. Chen, J. Ouyang, J. Melngailis, A.L. Roytburd, V. Vaithyanathan, D.G. Schlom, T. Zhao, and Ramamoorthy Ramesh."Effect of 90° domain movement on the piezoelectric response of patterned PbZr 0.2 Ti 0.8 O 3 SrTiO 3 Si heterostructures."Applied Physics Letters 87 (2005). DOI
Ouyang, J., Ramamoorthy Ramesh, and A.L. Roytburd."Effective direct piezoelectric constants in epitaxial ferroelectric films as MEMS sensors."Materials Research Society Symposium Proceedings 881 (2005) 125-130.
Ouyang, J., Ramamoorthy Ramesh, and A.L. Roytburd."Intrinsic effective piezoelectric coefficient e 31,f for ferroelectric thin films."Applied Physics Letters 86 (2005) 1-3. DOI
Ouyang, J., D.M. Kim, C.B. Eom, Ramamoorthy Ramesh, and A.L. Roytburd."Orientation dependence of the intrinsic converse longitudinal piezoelectric constant for 0.67Pb(Mg1/3Nb2/3)O3-0. 33PbTiO3 ferroelectric films with a rhombohedral structure."Smart Materials and Structures 14 (2005) 524-528. DOI
Li, , J., I. Levin, J. Slutsker, V. Provenzano, P.K. Schenck, Ramamoorthy Ramesh, J. Ouyang, and A.L. Roytburd."Self-assembled multiferroic nanostructures in the Co Fe 2 O 4 -PbTi O 3 system."Applied Physics Letters 87 (2005). DOI
Ouyang, J., Ramamoorthy Ramesh, and A.L. Roytburd."Theoretical predictions for the intrinsic converse longitudinal piezoelectric constants of lead zirconate titanate epitaxial films."Advanced Engineering Materials 7 (2005) 229-232. DOI

2004

Li, J.-H., L. Chen, V. Nagarajan, Ramamoorthy Ramesh, and A.L. Roytburd."Finite element modeling of piezoresponse in nanostructured ferroelectric films."Applied Physics Letters 84 (2004) 2626-2628. DOI
Chen, L., J. Ouyang, C.S. Ganpule, V. Nagarajan, Ramamoorthy Ramesh, and A.L. Roytburd."Formation of 90° elastic domains during local 180° switching in epitaxial ferroelectric thin films."Applied Physics Letters 84 (2004) 254-256. DOI
Ouyang, J., S.Y. Yang, L. Chen, Ramamoorthy Ramesh, and A.L. Roytburd."Orientation dependence of the converse piezoelectric constants for epitaxial single domain ferroelectric films."Applied Physics Letters 85 (2004) 278-280. DOI

2003

Chen, L., V. Nagarajan, Ramamoorthy Ramesh, and A.L. Roytburd."Nonlinear electric field dependence of piezoresponse in epitaxial ferroelectric lead zirconate titanate thin films."Journal of Applied Physics 94 (2003) 5147-5152. DOI

2002

Ganpule, C.S., V. Nagarajan, B.K. Hill, A.L. Roytburd, E.D. Williams, Ramamoorthy Ramesh, S.P. Alpay, A. Roelofs, R. Waser, and L.M. Eng."Imaging three-dimensional polarization in epitaxial polydomain ferroelectric thin films."Journal of Applied Physics 91 (2002) 1477-1481. DOI
Ganpule, C.S., A.L. Roytburd, V. Nagarajan, B.K. Hill, S.B. Ogale, E.D. Williams, Ramamoorthy Ramesh, and J.F. Scott."Polarization relaxation kinetics and 180° domain wall dynamics in ferroelectric thin films."Physical Review B - Condensed Matter and Materials Physics 65 (2002) 1-7. DOI
Ganpule, C.S., A.L. Roytburd, V. Nagarajan, B.K. Hill, S.B. Ogale, E.D. Williams, Ramamoorthy Ramesh, and J.F. Scott."Polarization relaxation kinetics and 180° domain wall dynamics in ferroelectric thin films."Physical Review B - Condensed Matter and Materials Physics 65 (2002) 141011-141017.
Nagarajan, V., A. Stanishevsky, L. Chen, T. Zhao, B.-T. Liu, J. Melngailis, A.L. Roytburd, Ramamoorthy Ramesh, J. Finder, Z. Yu, R. Droopad, and K. Eisenbeiser."Realizing intrinsic piezoresponse in epitaxial submicron lead zirconate titanate capacitors on Si."Applied Physics Letters 81 (2002) 4215-4217. DOI

2001

Alpay, S.P., A.L. Roytburd, V. Nagarajan, L.A. Bendersky, and Ramamoorthy Ramesh."Cellular domain architecture of stress-free epitaxial ferroelectric films."Materials Research Society Symposium - Proceedings 655 (2001) XLXXV-XLXXVI.
Nagarajan, V., C.S. Ganpule, H. Li, L. Salamanca-Riba, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh."Control of domain structure of epitaxial PbZr0.2Ti0.8O3 thin films grown on vicinal (001) SrTiO3 substrates."Applied Physics Letters 79 (2001) 2805-2807. DOI
Li, H., A.L. Roytburd, S.P. Alpay, T.D. Tran, L. Salamanca-Riba, and Ramamoorthy Ramesh."Dependence of dielectric properties on internal stresses in epitaxial barium strontium titanate thin films."Applied Physics Letters 78 (2001) 2354-2356. DOI
Ganpule, C.S., A.L. Roytburd, V. Nagarajan, A. Stanishevsky, J. Melngailis, E.D. Williams, and Ramamoorthy Ramesh."Nanoscale electromechanical phenomena in ferroelectric thin films."Materials Research Society Symposium - Proceedings 655 (2001) XVI-XVII.
Roytburd, A.L., S.P. Alpay, L.A. Bendersky, V. Nagarajan, and Ramamoorthy Ramesh."Three-domain architecture of stress-free epitaxial ferroelectric films."Journal of Applied Physics 89 (2001) 553-556. DOI

2000

Canedy, C.L., H. Li, S.P. Alpay, L. Salamanca-Riba, A.L. Roytburd, and Ramamoorthy Ramesh."Dielectric properties in heteroepitaxial Ba0.6Sr0.4TiO3 thin films: Effect of internal stresses and dislocation-type defects."Applied Physics Letters 77 (2000) 1695-1697. DOI
Ganpule, C.S., V. Nagarajan, S.B. Ogale, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh."Domain nucleation and relaxation kinetics in ferroelectric thin films."Applied Physics Letters 77 (2000) 3275-3277. DOI
Nagarajan, V., S.P. Alpay, C.S. Ganpule, B. Nagaraj, S. Aggarwal, A.L. Roytburd, E.D. Williams, and Ramamoorthy Ramesh."Epitaxial PMN-PT relaxor thin films: dependence of dielectric and piezoelectric properties on film thickness."Materials Research Society Symposium - Proceedings 596 (2000) 505-510.
Roytburd, A.L., S.P. Alpay, V. Nagarajan, C.S. Ganpule, S. Aggarwal, E.D. Williams, and Ramamoorthy Ramesh."Measurement of internal stresses via the polarization in epitaxial ferroelectric films."Physical Review Letters 85 (2000) 190-193. DOI