%0 Conference Paper
%B Ferroelectrics
%D 2003
%T Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy
%A Y. Cho
%A K. Matsuura
%A N. Valanoor
%A Ramamoorthy Ramesh
%K 180° c-c domain wall
%K 90° a-c domain wall
%K crystal structure
%K Dielectric materials
%K Ferroelectric materials
%K Linear dielectric constant
%K Magnetic domains
%K Nonlinear dielectric constant
%K Permittivity
%K PZT thin films
%K Scanning nonlinear dielectric microscopy
%K thin films
%X Using Scanning Nonlinear Dielectric Microscopy (SNDM) which has attained sub-nanometer resolution, we measured the linear dielectric constant of a-domains and c-domains in the (1,0,0) and (0,0,1) oriented PbZr 0.2 Ti 0.8 O 3 thin film and confirmed that the dielectric constant of a-domain is higher than that of c-domain. Next, we observed 90 domain walls (a-c domain walls) and 180 domain walls (c-c domain walls) and we obtained the minimum value of 180 c-c domain wall thickness was 1.87 nm and 90 a-c domain wall was 2.52 nm.
%B Ferroelectrics
%V 292
%P 171-180
%G eng
%R 10.1080/00150190390222961