TY - CONF
T1 - Correlation of electric field and critical design parameters for ferroelectric tunable microwave filters
T2 - Integrated Ferroelectrics
Y1 - 1999/
SP - 273
EP - 285
A1 - G. Subramanyam
A1 - F.W. Van Keuls
A1 - F.A. Miranda
A1 - C.L. Canedy
A1 - S. Aggarwal
A1 - T. Venkatesan
A1 - Ramamoorthy Ramesh
KW - Bandpass filters
KW - Bandwidth
KW - Barium compounds
KW - Barium strontium titanate
KW - Electric fields
KW - Ferroelectric materials
KW - Insertion losses
KW - Microstrip filters
KW - Microstrip lines
KW - Microwave filters
KW - Microwave frequencies
KW - thin films
KW - tuning
AB - The correlation of electric field and critical design parameters such as the insertion loss, frequency tunability, return loss, and bandwidth of conductor/ferroelectric/dielectric microstrip tunable K-band microwave filters is discussed in this work. This work is based primarily on barium strontium titanate (BSTO) ferroelectric thin film based tunable microstrip filters for room temperature applications. Two new parameters which we believe will simplify the evaluation of ferroelectric thin films for tunable microwave filters, are defined. The first of these, called the sensitivity parameter, is defined as the incremental change in center frequency with incremental change in maximum applied electric field (EPEAK) in the filter. The other, the loss parameter, is defined as the incremental or decremental change in insertion loss of the filter with incremental change in maximum applied electric field. At room temperature, the Au/BSTO/LAO microstrip filters exhibited a sensitivity parameter value between 15 and 5 MHz/cm/kV. The loss parameter varied for different bias configurations used for electrically tuning the filter. The loss parameter varied from 0.05 to 0.01 dB/cm/kV at room temperature.
JF - Integrated Ferroelectrics
PB - Gordon & Breach Science Publ Inc, Newark
VL - 24
N1 - cited By 17
ER -