TY - JOUR
T1 - Leakage current mechanisms in lead-based thin-film ferroelectric capacitors
JF - Physical Review B - Condensed Matter and Materials Physics
Y1 - 1999/
SP - 16022
EP - 16027
A1 - B. Nagaraj
A1 - S. Aggarwal
A1 - T.K. Song
A1 - T. Sawhney
A1 - Ramamoorthy Ramesh
AB - Current-voltage (Formula presented) behaviors of (Formula presented)-based capacitors with (Formula presented) electrodes were studied to investigate the dominant leakage mechanism. Epitaxial (Formula presented) capacitors were fabricated to simplify the analysis and eliminate any effects of granularity. The (Formula presented) characteristics were almost symmetric and temperature dependent with a positive temperature coefficient. The leakage current at low fields (
VL - 59
N1 - cited By 114
ER -