TY - CONF
T1 - Direct domain wall thickness measurement using scanning nonlinear dielectric microscopy
T2 - Ferroelectrics
Y1 - 2003/
SP - 171
EP - 180
A1 - Y. Cho
A1 - K. Matsuura
A1 - N. Valanoor
A1 - Ramamoorthy Ramesh
KW - 180° c-c domain wall
KW - 90° a-c domain wall
KW - crystal structure
KW - Dielectric materials
KW - Ferroelectric materials
KW - Linear dielectric constant
KW - Magnetic domains
KW - Nonlinear dielectric constant
KW - Permittivity
KW - PZT thin films
KW - Scanning nonlinear dielectric microscopy
KW - thin films
AB - Using Scanning Nonlinear Dielectric Microscopy (SNDM) which has attained sub-nanometer resolution, we measured the linear dielectric constant of a-domains and c-domains in the (1,0,0) and (0,0,1) oriented PbZr 0.2 Ti 0.8 O 3 thin film and confirmed that the dielectric constant of a-domain is higher than that of c-domain. Next, we observed 90 domain walls (a-c domain walls) and 180 domain walls (c-c domain walls) and we obtained the minimum value of 180 c-c domain wall thickness was 1.87 nm and 90 a-c domain wall was 2.52 nm.
JF - Ferroelectrics
VL - 292
N1 - cited By 1
ER -